Ellipsometer

Instrument:

Ellipsometer

Contact:

Kristin Bergum
Viktor Bobal

Technology Description:

Material Class:

Transparent solids

Technology Description:

Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters and is related to a variety of sample properties. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a nanometers to several micrometers.

Technical Information:

Type: Woolam Alpha SE

Wavelength: 380 - 900 nm

Technical Information:

Category: Characterization Area name: Clean Room Room area: 440 Model: AlphaSE Manufacturer: Woolam