SEM Hitachi SU 3500

Instrument:

SEM Hitachi SU 3500

Contact:

Tayyib Muhammad
Knut Aasmundtveit

Technology Description:

The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems to provide unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications including biological specimens and advanced materials, the SU3500 is sure to be the workhorse microscope in any laboratory.

Unparalleled Image Quality

All new electron optics design with best-in-class image sharpness. 7 nm SE Image Resolution at 3 kV, 10 nm BSE Image resolution at 5 kV.

Intuitive Operation

Wide-screen GUI and fast auto image optimization functions (7 seconds) via "delegation" technology.

Ultra Variable-Pressure Detector

Image surface information at low vacuum and low accelerating voltages.

Stereoscopic Image Function

Point and click for seamless, real-time "3D" image observation.

 

New Gun Bias System and Image Signal Processing allows quick and easy focus adjustment and astigmatism correction

High speed Automatic Focus Control (AFC) and Auto Brightness & Contrast Control (ABCC) function enable faster and optimized image observation

Accelearing voltages 0,3 to 30kV

Magnification 5 to 300,000 X

Maximum Specimen size 200mm diameter

Maximum Height 80mm

Technical Information:

Category: Characterization Area name: G1-33 Characterization lab Room area: 100 Model: SU3500 Manufacturer: Hitachi