Instrument: |
SEM APREO | |
Contact: |
Amin Hossein Zavieh
Ken Roger Ervik |
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Technology Description: |
FEI APREO is a Field Emmision scanning electron microscope (SEM) in which electrons are used to image the surface of a sample. This allows high magnifications.
Specifications:
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Technical Information: |
Category: Characterization Area name: EBL and SEM Model: APREO Manufacturer: FEI |
