Profilometer (Stylus)

Instrument:

Profilometer (Stylus)

Contact:

Ken Roger Ervik
Svenn Ove Linde

Technology Description:

A profilometer is used to measure surface profiles to determine the roughness of surfaces. The Dektak 150 is a contact stylus profilometer. The diamond tip stylus is run over a sample surface and records height differences which is sent to a computer.

 

Materials allowed: everything which is not considered as contaminating within NanoLab rules, sample size can’t exceed 150 mm in diameter and 90 mm in height.

  • Scan length range: 55 mm
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  • Vertical range: 524 µm
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  • Vertical resolution: 1 Å maximum (at 6.55 µm range)
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  • 12.5 µm diamond tip stylus

Technical Information:

Category: Characterization Area name: Characterisation Model: Dektak 150 Manufacturer: Veeco