Characterisation - NTNU NanoLab

Characterisation-equipment at NTNU NanoLab

• 3D Optical Profiler
• AFM Dimension Icon
• AFM, NanoSurf
• AFM, Nanosurf Flex
• AFM, Veeco
• Characterization area slot 1
• Characterization area slot 2
• DIC microscope
• FIB G4 (Advanced level)
• Fluorescence microscope
• Focused Ion Beam (FIB G2)
• JEOL SEM
• MiBots (micromanipulators)
• Micro-Raman Spectroscopy
• NanoDrop UV vis spectrophotometer
• Nanosight Nanoparticle Analysis System
• Particle size analyser
• Profilometer (Stylus)
• Raman room
• Reflectometer
• S(T)EM
• SECM
• SEM (Table Top)
• SEM APREO
• Stereomicroscope
• STM 1, Nanosurf
• STM 2, Nanosurf
• STM 3, Nanosurf