A variety of characterisation equipment for research and process control
Characterisation
USN MST-Lab
- Acoustic material characterisation
- Acoustic Pulse-Echo measurements
- AFM XE-200
- Elipsometer
- Gas chromatograph,Shimadzu
- Hall Instrument
- He- Leak Detector
- Impedance measurement
- Interferometer Wyko NT9100
- Optical Microscope I Leica DM4000M
- Optical Microscope II Neophot 32
- Optical microscope Leica DM3 XL
- Optical Microscope Olympus IX51/TH4-200
- Optical Microscope Olympus MVX10
- Probe Station PWS Probe II
- Probe station RF
- Probe Station, Pasific Western
- Probestation Cryo, Lakeshore
- SAM 300, PVA TePLA
- Scanning tank, Onda
- SEM Hitachi SU 3500
- SEM Hitachi SU 8230
- Spectrofluorometer FS5
- XRD
NTNU NanoLab
- 3D Optical Profiler
- AFM Dimension Icon
- AFM, NanoSurf
- AFM, Veeco
- DIC microscope
- Drop Shape Analyser DSA25
- FIB G4 (Advanced level)
- Fluorescence microscope
- Focused Ion Beam (FIB G2)
- JEOL SEM
- MiBots (micromanipulators)
- Micro-Raman Spectroscopy
- NanoDrop UV vis spectrophotometer
- Nanosight Nanoparticle Analysis System
- Particle size analyser
- Profilometer (Stylus)
- Reflectometer
- S(T)EM
- SECM
- SEM (Table Top)
- SEM APREO
- SMU
- Stereomicroscope
- STM 1, Nanosurf
- STM 2, Nanosurf
- STM 3, Nanosurf
UiO MiNaLab
- 4-point probe
- Ellipsometer
- Flextura - Angular-resolved UV photoemission spectroscopy (UPS) / (ARPES)
- Flextura - Low energy electron diffraction (LEED)
- Flextura - X-ray photoemission spectroscopy (XPS)
- FT-IR
- IT-300 SEM
- Low-temperature Hall (Cleanroom)
- Probe station
- QSSPC
- RBS
- Room-temperature Hall (Cleanroom)
- Room-temperature Hall (MEMS room)
- Solar simulator
- Spectrophotometer
- Stylus profiler
- Stylus profilometer
- Variable-temperature Hall (MEMS room)
- XRD
