A variety of characterisation equipment for research and process control
Characterisation
NTNU NanoLab
- 3D Optical Profiler
- AFM Dimension Icon
- AFM, NanoSurf
- AFM, Nanosurf Flex
- AFM, Veeco
- DIC microscope
- FIB G4 (Advanced level)
- Fluorescence microscope
- Focused Ion Beam (FIB G2) - (Entry Level)
- JEOL SEM
- MiBots (micromanipulators)
- Micro-Raman Spectroscopy
- NanoDrop UV vis spectrophotometer
- Nanosight Nanoparticle Analysis System
- Particle size analyser
- Profilometer (Stylus)
- Reflectometer
- S(T)EM
- SECM
- SEM (Table Top)
- SEM APREO
- Stereomicroscope
- STM 1, Nanosurf
- STM 2, Nanosurf
- STM 3, Nanosurf
