XRD

Instrument:

XRD

Contact:

Heine Nygard Riise
Vishnukanthan Venkatachalapathy

Technology Description:

Material Class:

 

Technology Description:

 

X-ray diffraction is an important method to characterize the structure of crystalline material. The technique can typically be used for the lattice parameters analysis of single crystals, or the phase, texture or even stress analysis of polycrystalline materials. The XRD at UiO MiNaLb has 5-degree of freedom motion control and particularly suitable for thin film characterization.

Technical Information:

Type: Bruker AXS D8 Discover

 

Technical Information:

Category: Characterization Area name: XRD-room Model: AXS D8 Discover Manufacturer: Bruker